The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Oct. 23, 2019
Carl Zeiss Microscopy Gmbh, Jena, DE;
Daniel Schwedt, Jena, DE;
Tiemo Anhut, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A microscope and method of microscopy having a light source for providing illumination light, a controllable manipulation device for generating in a variable manner an illumination pattern of the illumination light to be selected, an illumination beam path with a microscope lens for guiding the illumination pattern to a sample to be examined, a detector having a plurality of pixels for examining the fluorescent light emitted by the sample, a detection beam path for guiding the fluorescent light emitted by the sample to the detector, a main beam splitter for splitting illumination light and fluorescent light, a control and evaluation unit for controlling the manipulation device and for evaluating the data measured by the detector. The manipulation device is arranged in the illumination beam path upstream from the main beam splitter such that the pixel of the detector can be individually activated using the control and evaluation unit and in read out patterns to be selected.