The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Dec. 30, 2021
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Yuki Nitsuma, Kanagawa, JP;

Takaaki Kamisawa, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04L 43/045 (2022.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04L 43/045 (2013.01);
Abstract

The base station simulatoras a signal analysis device performs communication with the UEby simulating a base station to test the operation of the communication function of the UE, and includes a reception unitthat receives a signal to be measured modulated by an OFDM method from the UE; an analog signal processing unitthat calculates signal data of the signal to be measured received by the reception unit; a data analysis unitthat calculates power of the signal data for each frequency in each time, based on the signal data; and an analysis result display unitthat displays a distribution of the power of the signal data on a time axis and a frequency axis.


Find Patent Forward Citations

Nitsuma, Yuki. (2024). Signal analysis device and signal analysis result display method (U.S. Patent No. 12143841). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12143841

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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