The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Jan. 14, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;

Inventors:

Yun-Feng Kao, Hsinchu, TW;

Katherine H. Chiang, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/786 (2006.01); H01L 21/02 (2006.01); H01L 29/40 (2006.01); H01L 29/417 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/78696 (2013.01); H01L 21/02565 (2013.01); H01L 29/401 (2013.01); H01L 29/41733 (2013.01); H01L 29/66969 (2013.01); H01L 29/78603 (2013.01); H01L 29/7869 (2013.01);
Abstract

A transistor device including source and drain electrodes, a fin structure extending between and contacting respective sidewalls of the source and drain electrodes, a semiconductor channel layer over the upper surface and side surfaces of the fin structure and including a first and second vertical portions over the side surfaces of the fin structure, and the first and second vertical portions of the semiconductor channel layer both contact the respective sidewalls of the source electrode and the drain electrode, a gate dielectric layer over the semiconductor channel layer, and a gate electrode over the gate dielectric layer. By forming the semiconductor channel layer over a fin structure extending between sidewalls of the source and drain electrodes, a contact area between the semiconductor channel and the source and drain electrodes may be increased, which may provide increased driving current for the transistor device without increasing the device size.


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