The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Aug. 05, 2022
Applicant:

Affymetrix, Inc., Carlsbad, CA (US);

Inventors:

Glenn Fu, Dublin, CA (US);

Michael Shapero, Campbell, CA (US);

Pei-Hua Wang, Fremont, CA (US);

Assignee:

AFFYMETRIX, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C40B 50/06 (2006.01); C12Q 1/6837 (2018.01); C12Q 1/6844 (2018.01); C12Q 1/6858 (2018.01);
U.S. Cl.
CPC ...
C40B 50/06 (2013.01); C12Q 1/6837 (2013.01); C12Q 1/6844 (2013.01); C12Q 1/6858 (2013.01);
Abstract

Methods are provided for multiplexed amplification of selected targets and analysis of the amplified targets. In preferred aspects the amplification and analysis take place on the same solid support and preferably in a localized area such as a bead or a feature of an array. In preferred aspects the analysis is a determination of sequence at one or more locations in the amplified target. The methods may be used for genotyping, sequencing and analysis of copy number.


Find Patent Forward Citations

Loading…