The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

Dec. 08, 2020
Applicant:

Guangzhou Heygears Imc.inc, Guangdong, CN;

Inventors:

Xin Wan, Guangzhou, CN;

Weitao Li, Guangzhou, CN;

Peihui Wu, Guangzhou, CN;

Songlin She, Guangzhou, CN;

Peiyan Gui, Guangzhou, CN;

Heyuan Huang, Guangzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); B29C 64/386 (2017.01); B33Y 50/00 (2015.01); G06T 7/73 (2017.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); B29C 64/386 (2017.08); B33Y 50/00 (2014.12); G06T 7/73 (2017.01); G06T 7/80 (2017.01);
Abstract

Disclosed are a method and system for optical calibration of a 3D printer. The method includes: projecting, by an optical apparatus, a projection image to a projection platform, placing a calibration plate on the projection platform, and capturing the projection platform; identifying the coordinates of calibration points and the coordinates of actual projection points according to the captured image to obtain a matrix of calibration points and a matrix of actual projection points; rotating and translating the matrix of the calibration points and/or the matrix of the actual projection points, and calculating a distance value Tbetween the calibration points and the actual projection points in an image coordinate system; converting the Tin the image coordinate system into an offset Cin a pixel coordinate system, and inversely distorting an initial ideal projection image according to the offset Cto offset optical distortion.


Find Patent Forward Citations

Wan, Xin. (2024). Method and system for optical calibration of 3d printer (U.S. Patent No. 12137203). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12137203

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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