The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

Dec. 01, 2021
Applicant:

Yangtze Memory Technologies Co., Ltd., Wuhan, CN;

Inventors:

Yangyang Zhang, Wuhan, CN;

Feng Ru, Wuhan, CN;

Yi Chen, Wuhan, CN;

Mengda Wang, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01); G01R 31/31919 (2013.01); G01R 31/31924 (2013.01);
Abstract

In certain aspects, a waveform driving device for a tester channel includes a waveform generator, a bit map register, and an output logic circuit. The waveform generator is configured to generate a waveform signal based on a driving source signal. The bit map register is configured to store a bit map associated with the tester channel. The output logic circuit is coupled to the bit map register and the waveform generator, and configured to control an output of the waveform signal through the tester channel based on a bit control signal from the bit map.


Find Patent Forward Citations

Zhang, Yangyang. (2024). Tester channel multiplexing in test equipment (U.S. Patent No. 12136958). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12136958

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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