The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2024
Filed:
Dec. 23, 2019
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventor:
Naweed Anjum, Murphy, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/30 (2020.01); G01R 31/28 (2006.01); G06F 30/367 (2020.01); H01L 21/66 (2006.01); G06F 113/18 (2020.01); G06F 119/02 (2020.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
H01L 22/34 (2013.01); G01R 31/2853 (2013.01); G01R 31/2856 (2013.01); G01R 31/2896 (2013.01); G06F 30/367 (2020.01); H01L 22/32 (2013.01); G06F 2113/18 (2020.01); G06F 2119/02 (2020.01); G06F 2119/18 (2020.01);
Abstract
In a described example, a method includes: providing a product package for a product die; building a product mimic die that mimics the product die and which is configured to make the product package functional for use in reliability testing; packaging the product mimic die in the product package to form a packaged product mimic die; reliability testing the packaged product mimic die; responsive to the reliability testing, revising the product package; and repeating the steps of reliability testing and revising the product package until the product package passes the reliability tests.