The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Feb. 10, 2022
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Jack Rogers, Albany, NY (US);

Satohiko Hoshino, Albany, NY (US);

Nathan Antonovich, Albany, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 24/80 (2013.01); H01L 24/08 (2013.01); H01L 2224/08145 (2013.01); H01L 2224/80013 (2013.01); H01L 2224/8002 (2013.01); H01L 2224/80895 (2013.01); H01L 2224/80896 (2013.01); H01L 2924/0509 (2013.01);
Abstract

Technologies for plasma oxidation protection during hybrid bonding of semiconductor devices includes forming a blocking layer on a metallic bonding pad formed in a bonding surface of a semiconductor device to be bonded and performing a surface treatment on the bonding surface to increase the bonding strength of the bonding surface and contemporaneously remove the blocking layer from the metallic bonding pad. In an illustrative embodiment, the blocking layer is embodied as a self-assembled monolayer (SAM), and the surface treatment is embodied as a surface activation plasma (SAP) treatment. A diffusion barrier layer, such as a silicon carbon nitride layer, may form the bonding surface in some embodiments to reduce diffusion of the metallic bonding pad during an annealing treatment of the bonding process.


Find Patent Forward Citations

Loading…