The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Aug. 27, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Jackson Callaghan, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 65/70 (2022.01); G06F 3/06 (2006.01); H04L 7/00 (2006.01); H04L 25/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 3/0673 (2013.01); H04L 7/0037 (2013.01); H04L 25/063 (2013.01);
Abstract

Methods, apparatuses, and systems related to operations for measuring the quality of a signal received by a memory device and providing feedback. The memory device can sample signal data using a predetermined sequence of timing offsets relative to a reference signal. Additionally or alternatively, the memory device can sample the signal data using a predetermined sequence of reference voltages. The memory device can provide feedback results to a controller regarding the quality of the sampled signal data.


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