The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Apr. 28, 2022
Advantest Corporation, Tokyo, JP;
Jochen Rivoir, Magstadt, DE;
Advantest Corporation, Tokyo, JP;
Abstract
Systems and methods for performing device testing using automatic test equipment that can advantageously utilize relatively large numbers of test scenarios and activities including multiple test steps and resources and that prevents test parameters from conflicting or colliding to improve test performance and accuracy are disclosed herein. The test activities of a given test scenario can be configured to be executed concurrently. The test activities can be associated with one or more test parameters characterized by respective test parameter values and/or are associated with one or more constraints.
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