The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Apr. 01, 2021
Applicant:

Nearfield Instruments B.v., Rotterdam, NL;

Inventor:

Paul Zabbal, Amsterdam, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/24 (2010.01); G01N 29/06 (2006.01); G01Q 30/04 (2010.01); G01Q 60/32 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/32 (2013.01); G01N 29/06 (2013.01); G01Q 30/04 (2013.01);
Abstract

The present document relates to a method to determine dimensions of features of a subsurface topography of a sample, the features having a spatial periodicity. The subsurface topography is obtained using scanning probe microscopy. The method includes obtaining measurement values of an acoustic output signal in at least N locations and generating a location dependent subsurface topography signal. The method further comprises providing an autocorrelation matrix by performing a cross-correlation of the subsurface topography signal in respect of each further location to yield the autocorrelation matrix having size N*N. Thereafter, the method includes performing an Eigenvalue decomposition for obtaining Eigenvalues of the matrix, and selecting a subset of Eigenvalues having the largest values. From these a frequency estimation function is constructed and at least one output value indicative of the spatial periodicity is obtained therefrom. The document also describes a scanning probe microscopy system and a computer program product.


Find Patent Forward Citations

Zabbal, Paul. (2024). Method of determining dimensions of features of a subsurface topography, scanning probe microscopy system and computer program (U.S. Patent No. 12123895). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12123895

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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