The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Mar. 12, 2019
Applicant:

Southeast University, Jiangsu, CN;

Inventors:

Peng Cao, Jiangsu, CN;

Bingqian Xu, Jiangsu, CN;

Jingjing Guo, Jiangsu, CN;

Mengxiao Li, Jiangsu, CN;

Jun Yang, Jiangsu, CN;

Assignee:

Southeast University, Jiangsu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G01R 31/2882 (2013.01);
Abstract

A method for predicting the fluctuation of circuit path delay on the basis of machine learning, comprising the following steps: S1: selecting suitable sample characteristics by means of analyzing the relationship between circuit characteristics and path delay; S2: generating a random path by means of enumerating values of randomized parameters, acquiring the maximum path delay by means of performing Monte Carlo simulation on the random path, selecting a reliable path by means of the 3σ standard, and using the sample characteristics and path delay of the reliable path as a sample set (D); S3: establishing a path delay prediction model, and adjusting parameters of the model; S4: verifying the precision and stability of the path delay prediction model; S5: obtaining the path delay. The method for predicting the fluctuation of circuit path delay on the basis of machine learning has the advantages of high precision and low running time, thereby having remarkable advantages in the accuracy and efficiency of timing analysis.


Find Patent Forward Citations

Loading…