The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Jun. 07, 2022
Xepic Corporation Limited, Nanjing, CN;
Wu Huang, Shanghai, CN;
XEPIC CORPORATION LIMITED, Nanjing, CN;
Abstract
A method for generating test cases. The test cases are used to test a plurality of functional units of a logic system design during a simulation process of the logic system design. The method includes acquiring a constraint for generating test cases, and generating a first set of test cases according to the constraint. The first set of test cases is used to cover a part of the plurality of functional units. The method further includes performing a test on the logic system design based on the first set of test cases, determining uncovered functional units that are not covered by the test and a current coverage of the test, and, in response to the current coverage failing to satisfy a preset test coverage condition, generating a second set of test cases according to the uncovered functional units.