The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Feb. 17, 2023
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Rahul Mitchell Jairaj, Boise, ID (US);

Mark A. Hawes, Boise, ID (US);

Terry M. Grunzke, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/07 (2006.01); G06F 11/14 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/0772 (2013.01); G06F 11/1048 (2013.01); G06F 11/1489 (2013.01); G06F 11/3037 (2013.01);
Abstract

Devices and techniques to recover data from a memory device are disclosed, including recovering data corresponding to a detected error in data stored on a memory array corresponding to a memory operation using one of a set of read offset values and loading the one of the set of read offset values used to recover data corresponding to the detected error in a temporary storage of the memory array as a custom read offset value for a subsequent memory operation. The temporary storage of the memory array can include a scratch space of the memory array separate from read retry offset registers of the memory device.


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