The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
May. 12, 2020
Applicant:
Horiba, Ltd., Kyoto, JP;
Inventors:
Assignee:
HORIBA, LTD., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/39 (2006.01); G01J 3/433 (2006.01); G01N 1/44 (2006.01); G01N 21/3504 (2014.01); G01N 21/31 (2006.01); G01N 21/3518 (2014.01);
U.S. Cl.
CPC ...
G01N 21/39 (2013.01); G01J 3/4338 (2013.01); G01N 21/3504 (2013.01); G01N 1/44 (2013.01); G01N 2021/3129 (2013.01); G01N 21/3518 (2013.01);
Abstract
A sample analyzing apparatus analyzes a component to be measured securely while reducing a frequency of maintenance of the sample analyzing apparatus. The sample analyzing apparatus includes a heating furnace that heats a sample held by a sample holding body and a gas analysis section that analyzes a component to be measured contained in a gas generated by heating the sample, and the gas analysis section includes a laser light source that irradiates the gas with a laser light, and a photodetector that detects an intensity of a sample light as being the laser light that has transmitted through the gas.