The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Aug. 17, 2021
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Shu-ping Yeh, Campbell, CA (US);
Jaemin Han, Portland, OR (US);
Wei Mao, San Jose, CA (US);
Jingwen Bai, San Jose, CA (US);
Murali Narasimha, Lake Oswego, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 43/0829 (2022.01); H04L 1/00 (2006.01); H04L 41/0823 (2022.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04L 41/0836 (2013.01); H04L 1/0003 (2013.01); H04L 1/0009 (2013.01); H04L 43/0829 (2013.01); H04W 24/10 (2013.01);
Abstract
Embodiments of a virtualized radio-access network (RAN) node configured to implement functions including an O-RAN Distributed Unit (DU), an O-RAN Radio Unit (RU), an O-RAN Central Unit-Control Plane (CU-CP), and an O-RAN Central Unit-User Plane (CU-UP), are described herein. In some embodiments, a reliability enhancement strategy is determined according to measurement reports collected from user equipment (UEs), the DU and the CU-UP.