The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Aug. 24, 2022
Micron Technology, Inc., Boise, ID (US);
Kishore Kumar Muchherla, Fremont, CA (US);
Robert Loren O. Ursua, Folsom, CA (US);
Sead Zildzic, Rancho Cordova, CA (US);
Eric N. Lee, San Jose, CA (US);
Jonathan S. Parry, Boise, ID (US);
Lakshmi Kalpana K. Vakati, Fremont, CA (US);
Jeffrey S. McNeil, Nampa, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A system can include a processing device operatively coupled with the one or more memory devices, to perform operations that include writing data to the one or more memory devices and performing one or more scan operations on a management unit containing the data to determine a current value of a chosen data state metric. Each scan operation can be performed using a corresponding predetermined read-time parameter value. The operations can include determining whether the current value of the chosen data state metric satisfies a criterion, and can also include, responsive to determining that the current value of the chosen data state metric satisfies the criterion, selecting a remedial operation by determining whether redundancy metadata is included in a fault tolerant data stripe on the one or more memory devices. The operations can also include performing the remedial operation with respect to the management unit.