The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Jul. 15, 2022
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Songgan Zang, Shanghai, CN;
Qi Shao, Shanghai, CN;
Lifeng Zhang, Shanghai, CN;
Ahmet Tokuz, Santa Clara, CA (US);
Lu Lu, Beijing, CN;
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Abstract
A system and method for efficiently routing scan data between two dies used in three-dimensional packaging are described. In various implementations, a computing system includes at least a first semiconductor die (or first die) and a second die connected to one another within a three-dimensional (3D) package. The first die and the second die have multiple non-scan input/output (I/O) data channels between them for data transfer. The non-scan I/O data channels are partitioned into groups. The first die receives a given scan input data bit for testing a device under test (DUT) on the second die. The first die selects a first group of non-scan I/O data channels, and sends, to the second die, a copy of the given scan input data bit on each non-scan I/O data channel of the first group. The second die uses a voter circuit to determine the value of the given scan input data bit.