The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Feb. 28, 2022
Applicant:
Advantest Corporation, Tokyo, JP;
Inventors:
Jan Hesselbarth, Stuttgart, DE;
José Moreira, Stuttgart, DE;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/302 (2006.01); G01R 1/04 (2006.01); G01R 31/28 (2006.01); G01R 31/303 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3025 (2013.01); G01R 1/045 (2013.01); G01R 31/2822 (2013.01); G01R 31/303 (2013.01); H01L 22/14 (2013.01); H01L 2924/00 (2013.01); H01L 2924/0002 (2013.01);
Abstract
Devices for testing a DUT having a circuit coupled to an antenna are disclose. The device can include a DUT location for receiving a DUT, and an adapter or probe is used to wirelessly 'over-the-air' (OTA) electronically test a DUT with an embedded antenna or antenna array with the measurement probelocated in close proximity to the DUT. The probe can be located very close to the DUT (e.g., in the near-field region). Although the probe is located in close proximity to the DUT antenna or antenna array elements it does not significantly disturb or interfere with probe during testing.