The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Oct. 03, 2022
Applicant:

Semes Co., Ltd., Chungcheongnam-do, KR;

Inventors:

Jae Duck Lee, Gyeonggi-do, KR;

Han Lim Kang, Seoul, KR;

Won Yong Jin, Jeollabuk-do, KR;

Suk Won Jang, Gyeonggi-do, KR;

Assignee:

SEMES CO., LTD., Chungcheongnam-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/125 (2006.01); B41J 2/045 (2006.01); G01N 15/1434 (2024.01);
U.S. Cl.
CPC ...
B41J 2/125 (2013.01); B41J 2/0454 (2013.01); B41J 2/04561 (2013.01); G01N 15/1436 (2013.01); G01N 2015/1438 (2013.01); G01N 2015/144 (2013.01);
Abstract

Provided are a fringe information measuring apparatus that measures information on a fringe region using a temperature sensor array and a substrate treating system including the same. The fringe information measuring apparatus comprises: a laser sensor configured to output a first laser light and a second laser light to intersect each other; a thermal sensor array configured to pass through a fringe region formed by the intersection of the first laser light and the second laser light; and a control module configured to measure a position of the fringe region based on information obtained when the thermal sensor array passes through the fringe region.


Find Patent Forward Citations

Lee, Jae. (2024). Fringe information measuring apparatus and substrate treating system including the same (U.S. Patent No. 12097696). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12097696

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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