The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Apr. 17, 2023
Applicant:

Tahoe Research, Ltd., Dublin, IE;

Inventors:

Mihir K. Roy, Chandler, AZ (US);

Mathew J. Manusharow, Phoenix, AZ (US);

Assignee:

Tahoe Research, Ltd., Dublin, IE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/538 (2006.01); H01L 21/48 (2006.01); H01L 23/00 (2006.01); H01L 23/13 (2006.01); H01L 23/14 (2006.01); H01L 25/00 (2006.01); H01L 25/065 (2023.01); H01L 25/18 (2023.01);
U.S. Cl.
CPC ...
H01L 23/5386 (2013.01); H01L 21/4853 (2013.01); H01L 21/4857 (2013.01); H01L 23/13 (2013.01); H01L 23/5381 (2013.01); H01L 23/5383 (2013.01); H01L 23/5385 (2013.01); H01L 24/14 (2013.01); H01L 24/17 (2013.01); H01L 24/25 (2013.01); H01L 24/81 (2013.01); H01L 25/0655 (2013.01); H01L 25/18 (2013.01); H01L 25/50 (2013.01); H01L 23/147 (2013.01); H01L 24/13 (2013.01); H01L 2224/13101 (2013.01); H01L 2224/1412 (2013.01); H01L 2224/14505 (2013.01); H01L 2224/16225 (2013.01); H01L 2224/16238 (2013.01); H01L 2224/1712 (2013.01); H01L 2224/24146 (2013.01); H01L 2224/2541 (2013.01); H01L 2224/81193 (2013.01); H01L 2224/81203 (2013.01); H01L 2224/81815 (2013.01); H01L 2224/81986 (2013.01); H01L 2924/12042 (2013.01); H01L 2924/1432 (2013.01); H01L 2924/14335 (2013.01); H01L 2924/1434 (2013.01); H01L 2924/15153 (2013.01); H01L 2924/15747 (2013.01); H01L 2924/381 (2013.01);
Abstract

Embodiments that allow both high density and low density interconnection between microelectronic die and motherboard via. Direct Chip Attach (DCA) are described. In some embodiments, microelectronic die have a high density interconnect with a small bump pitch located along one edge and a lower density connection region with a larger bump pitch located in other regions of the die. The high density interconnect regions between die are interconnected using an interconnecting bridge made out of a material that can support high density interconnect manufactured into it, such as silicon. The lower density connection regions are used to attach interconnected die directly to a board using DCA. The high density interconnect can utilize current Controlled Collapsed Chip Connection (C4) spacing when interconnecting die with an interconnecting bridge, while allowing much larger spacing on circuit boards.


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