The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Aug. 17, 2022
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Jun Xu, San Jose, CA (US);
Kitae Park, Cupertino, CA (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 16/10 (2006.01); G11C 16/14 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12 (2013.01); G11C 16/10 (2013.01); G11C 16/14 (2013.01); G11C 16/3445 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/1204 (2013.01);
Abstract
A system includes a memory device including a memory array and control logic, operatively coupled with the memory array, to perform operations including causing an erase operation to be performed. The erase operation includes sub-operations. The operations further include causing defect detection to be performed during at least one sub-operation of the sub-operations. The defect detection is performed using at least one defect detection method with respect to at least one failure point.