The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Nov. 24, 2020
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Sameer Sheorey, Santa Clara, CA (US);

Avinash Kumar, Santa Clara, CA (US);

Michael Schmidt, Beaverton, OR (US);

Abel Shin, Cypress, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 3/4007 (2024.01); H04N 13/20 (2018.01); H04N 23/695 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
G06T 7/85 (2017.01); G06T 3/4007 (2013.01); H04N 13/20 (2018.05); H04N 23/695 (2023.01); H04N 23/90 (2023.01);
Abstract

Techniques related to calibration of wide-baseline outside-in multi camera systems are discussed. Such techniques include receiving video sequences and intrinsic parameters corresponding to each of the cameras in the system, generating first extrinsic parameters for the cameras using tracked features and the intrinsic parameters and second extrinsic parameters using location parameters corresponding to motion control systems coupled to the cameras, and combining the first and second extrinsic parameters to provide real-time calibration of extrinsic parameters for the cameras.


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