The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Mar. 24, 2021
Applicant:

Changxin Memory Technologies, Inc., Anhui, CN;

Inventor:

Shu-Liang Ning, Hefei, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 30/333 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2889 (2013.01); G06F 30/333 (2020.01);
Abstract

A chip and a chip test system are provided by the present invention. The chip includes a decoding module and a test mode control module, and decodes an input signal to determine whether the input signal is a pre-activation signal or not. If the input signal is decoded into a pre-activation signal, then the chip will respond to a subsequent test signal; otherwise, the chip will not respond to any subsequent test signal. According to the present invention, by configuring a pre-activation signal, the number of chips to be simultaneously connected to and individually tested by the test equipment can be increased, without the need to occupy more input/output (I/O) interfaces.


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Ning, Shu-Liang. (2024). Chip and chip test system (U.S. Patent No. 12092685). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12092685

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