The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Apr. 20, 2022
Applicant:
Illumina, Inc., San Diego, CA (US);
Inventors:
Tingting Jiang, San Diego, CA (US);
Chen Zhao, San Diego, CA (US);
Han-Yu Chuang, San Diego, CA (US);
Assignee:
Illumina, Inc., San Diego, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G06N 3/047 (2023.01); G06N 3/126 (2023.01); G16B 20/00 (2019.01); G16B 20/20 (2019.01); G16B 30/00 (2019.01); G16B 30/10 (2019.01); G16B 40/00 (2019.01); G16B 35/00 (2019.01); G16C 20/60 (2019.01);
U.S. Cl.
CPC ...
G16B 20/20 (2019.02); G06N 3/047 (2023.01); G06N 3/126 (2013.01); G16B 20/00 (2019.02); G16B 30/00 (2019.02); G16B 30/10 (2019.02); G16B 40/00 (2019.02); G16B 35/00 (2019.02); G16C 20/60 (2019.02);
Abstract
Methods and systems are provided for determining a variant of interest by analyzing sizes and sequences of cfDNA fragments obtained from a test sample. The methods and systems provided herein implement processes that synergistically combine size and sequence information, thereby improving specificity and sensitivity of assays over conventional methods.