The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Mar. 16, 2021
HI Llc, Los Angeles, CA (US);
Ryan Field, Culver City, CA (US);
Jacob Dahle, Arlington, MA (US);
Rong Jin, Acton, MA (US);
Alex Borisevich, Los Angeles, CA (US);
Sebastian Sorgenfrei, Playa Vista, CA (US);
Bruno Do Valle, Brighton, MA (US);
HI LLC, Culver City, CA (US);
Abstract
An exemplary optical measurement system described herein includes a control circuit configured to output a global bias voltage and a module communicatively coupled to the control circuit. The module includes a light source configured to emit light directed at a target. The module further includes a plurality of detectors configured to detect arrival times for photons of the light after the light is scattered by the target. The module further includes a module control circuit configured to receive the global bias voltage and output a plurality of detector bias voltages based on the global bias voltage. The plurality of detector bias voltages include a respective detector bias voltage for each detector of the plurality of detectors.