The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Mar. 09, 2022
Micron Technology, Inc., Boise, ID (US);
Vanaja Urrinkala, San Diego, CA (US);
Sharath Chandra Ambula, Telangana, IN;
Micron Technology, Inc., Boise, ID (US);
Abstract
Methods, systems, and devices for improved performance in a fragmented memory system are described. The memory system may detect conditions associated with a random access parameter stored at the memory system to assess a level of data fragmentation. The memory system may determine that a random access parameter, such as a data fragmentation parameter, a size of information associated with an access command, a depth of a command queue, a delay duration, or a quantity of commands satisfies a threshold. If one or more of the random access parameters satisfies the threshold, the memory system may transmit a request for the host system to increase an associated clock frequency. The host system may increase the number of commands sent to the memory system in a duration of time. That is, the host system may compensate for a slow-down due to data storage fragmentation by increasing the command processing rate.