The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Dec. 28, 2020
Advantest Corporation, Tokyo, JP;
Mei-Mei Su, San Jose, CA (US);
Eddy Wayne Chow, San Jose, CA (US);
Edmundo De La Puente, San Jose, CA (US);
Advantest Corporation, Tokyo, JP;
Abstract
An automated test equipment (ATE) system comprises a system controller communicatively coupled to a tester processor, where the system controller is operable to transmit instructions to the tester processor, and where the tester processor is operable to generate commands and data from the instructions for coordinating testing of a plurality of devices under test (DUTs). The apparatus also comprises an FPGA programmed to support a first protocol communicatively coupled to the tester processor comprising at least one hardware accelerator circuit operable to internally generate commands and data transparently from the tester processor for testing a DUT of the plurality of DUTs. Further, the apparatus comprises a bus adapter comprising a protocol converter module operable to convert signals associated with the first protocol received from the FPGA to signals associated with a second protocol prior to transmitting the signals to the DUT, wherein the DUT communicates using the second protocol.