The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Apr. 26, 2022
Applicant:

HI Llc, Los Angeles, CA (US);

Inventors:

Michael Henninger, Austin, TX (US);

Isai Olvera, South Portland, ME (US);

Han Yong Ban, Los Angeles, CA (US);

Ryan Field, Culver City, CA (US);

Assignee:

HI LLC, Culver City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01); G01J 1/16 (2006.01); G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0474 (2013.01); G01J 1/0422 (2013.01); G01J 2001/1668 (2013.01); G01J 2001/444 (2013.01);
Abstract

An illustrative calibration member made from a material that scatters light may be used to perform a calibration operation with respect to an optical measurement device having a plurality of light sources and a plurality of detectors distributed among a plurality of modules. The calibration member may form an exterior surface configured to support the optical measurement device and scatter photons of light emitted by the optical measurement device. The calibration operation may be performed based on arrival times of the scattered photons detected by the optical measurement device.


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