The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Mar. 22, 2023
Verb Surgical Inc., Santa Clara, CA (US);
Darrick Tyler Sturgeon, Oakland, CA (US);
Jocelyn Elaine Barker, San Jose, CA (US);
Varun Kejriwal Goel, Oakland, CA (US);
Taylor W. Aronhalt, Loveland, OH (US);
Verb Surgical Inc., Santa Clara, CA (US);
Abstract
An analysis system trains a machine learning model to detect stapling events from a video of a surgical procedure. The machine learning model detects times when stapling events occur as well as one or more characteristics of each stapling event such as length of staples, clamping time, or other characteristics. The machine learning model is trained on videos of surgical procedures identifying when stapling events occurred through a learning process. The machine learning model may be applied to an input video to detect a sequence of stapler events. Stapler event sequences may furthermore be analyzed and/or aggregated to generate various analytical data relating to the surgical procedures for applications such as inventor management, performance evaluation, or predicting patient outcomes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile