The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Apr. 04, 2022
Applicant:

Proteantecs Ltd., Haifa, IL;

Inventors:

Eyal Fayneh, Givatayim, IL;

Guy Redler, Haifa, IL;

Evelyn Landman, Haifa, IL;

Ishai Zeev Cohen, Haifa, IL;

Shaked Rahamim, Geva Carmel, IL;

Alex Khazin, Nesher, IL;

Assignee:

PROTEANTECS LTD., Haifa, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/30 (2006.01); G01R 31/3173 (2006.01); H01L 23/538 (2006.01); H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3016 (2013.01); G01R 31/3173 (2013.01); H01L 23/5386 (2013.01); H03K 19/00323 (2013.01);
Abstract

An input/output (I/O) sensor for a multi-IC module. The I/O sensor includes: delay circuitry, configured to receive a data signal from an interconnected part of an IC of the multi-IC module and to generate a delayed data signal, the delay circuitry including an adjustable delay-line configured to delay an input signal by a set time duration; a comparison circuit, configured to generate a comparison signal by comparing the data signal with the delayed data signal; and processing logic, configured to set the time duration of the adjustable delay-line and, based on the comparison signal, identify a margin measurement of the data signal for determining an interconnect quality parameter.


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