The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2024
Filed:
Feb. 07, 2022
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Karl D. Schuh, Santa Cruz, CA (US);
William Richard Akin, Morgan Hill, CA (US);
Assignee:
MICRON TECHNOLOGY, INC., Boise, ID (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/0604 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01);
Abstract
Exemplary methods, apparatuses, and systems include determining that a memory component to be subjected to a background data integrity scan does not currently satisfy an activity threshold. The background data integrity scan is delayed in response to determining memory component does not satisfy the activity threshold. In response to detecting a background data integrity scan trigger event, the background data integrity scan is performed.