The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

May. 12, 2022
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Vijayalakshmi Ramachandran, Chandler, AZ (US);

Mingming Xu, Phoenix, AZ (US);

Dror Lazar, Kiryat Bialik, IL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/20 (2006.01); G01R 31/28 (2006.01); G05F 1/46 (2006.01);
U.S. Cl.
CPC ...
G06F 13/20 (2013.01); G01R 31/2889 (2013.01); G05F 1/46 (2013.01); G06F 2213/40 (2013.01);
Abstract

Techniques and mechanisms for determining a reference voltage which is to be provided with an integrated circuit (IC) die. In an embodiment, the IC die comprises a resistor, and a hardware interface which accommodates coupling of the IC die to a test unit. The test unit provides functionality to perform an evaluation of a resistance of the resistor, wherein said resistance is indicative of the respective resistances of one or more other resistors of the IC die. Based on the evaluation, the test unit provides to the IC die an indication of a scale factor, wherein the reference voltage is generated based on the scale factor. In another embodiment, the IC die further comprises an amplifier circuit which receives the reference voltage, wherein a variable resistance circuit of the IC die is configured based on an output of the amplifier circuit.


Find Patent Forward Citations

Loading…