The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Dec. 02, 2019
Applicant:

Kyocera Corporation, Kyoto, JP;

Inventors:

Kazuhiro Ishikawa, Shiga, JP;

Takashi Hino, Yokohama, JP;

Shuichi Saito, Yokohama, JP;

Assignee:

Kyocera Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 14/08 (2006.01); C04B 35/10 (2006.01); C04B 35/505 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
C23C 14/083 (2013.01); C04B 35/10 (2013.01); C04B 35/505 (2013.01); C23C 14/081 (2013.01); H01J 37/32467 (2013.01); H01J 37/32477 (2013.01); H01J 2237/3328 (2013.01);
Abstract

Provided are a member for plasma processing device which has an excellent plasma resistance and improved adhesion strength of a film to a base material, and a plasma processing device provided with the same. A member for plasma processing device includes: a base material containing a first element which is a metal element or a metalloid element; a film containing a rare-earth element oxide, or a rare-earth element fluoride, or a rare-earth element oxyfluoride as a major constituent, the film being located on the base material; and an amorphous portion containing the first element, a rare earth element, and at least one of oxygen and fluorine, the amorphous portion being interposed between the base material and the film.


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