The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Jan. 11, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Michael Richard Spica, Eagle, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/38 (2006.01); G01R 31/3177 (2006.01); G11C 29/36 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G11C 29/32 (2006.01); G11C 29/48 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G01R 31/3177 (2013.01); G11C 29/36 (2013.01); G01R 31/31724 (2013.01); G01R 31/318536 (2013.01); G01R 31/318555 (2013.01); G01R 31/318566 (2013.01); G01R 31/318572 (2013.01); G01R 31/318575 (2013.01); G11C 2029/3202 (2013.01); G11C 29/48 (2013.01);
Abstract

A system comprises a testing mode register, a set of pins, and a test access port controller. The test access port controller initiates a first testing mode by configuring the set of pins according to a first pin protocol. The test access port controller configures a first pin to receive first test pattern data based on a first convention and configures a second pin to output first test result data based on the first test pattern data. Based on detecting a register command stored in the testing mode register, the test access port controller initiates a second testing mode by configuring the set of pins according to a second pin protocol. The test access port controller configures the first pin to receive a second test pattern data generated based on a second convention and configures the second pin to output a second test result data based on the second test pattern data.


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