The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Jan. 25, 2019
Carl Zeiss Microscopy Gmbh, Jena, DE;
Ecole Polytechnique Federale DE Lausanne, Lausanne, CH;
Tiemo Anhut, Jena, DE;
Daniel Schwedt, Jena, DE;
Ivan Michel Antolovic, Lausanne, CH;
Claudio Bruschini, Villars-sous-Yens, CH;
Edoardo Charbon, Jouxtens-Mezery, CH;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A light microscope has a light source for illuminating a specimen, a photon-counting detector array with a plurality of photon-counting detector elements for measuring detection light coming from the specimen, wherein the photon-counting detector elements are configured to output respective measured photon count rates, and a control device for controlling the photon-counting detector array. The control device is configured to individually influence the measurable photon count rates which are simultaneously measurable with different photon-counting detector elements and/or which are consecutively measurable with the same photon-counting detector element. Furthermore, in an imaging method the measurable photon count rates of photon-counting detector elements are individually influenced to increase the signal-to-noise ratio for the photon-counting detector array.