The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Aug. 29, 2022
Applicant:

Fremonta Corporation, Fremont, CA (US);

Inventors:

Eric Wilhelmsen, Fremont, CA (US);

Yongqing Huang, Fremont, CA (US);

Florence Wu, Fremont, CA (US);

Garth Hoffmann, Fremont, CA (US);

Wei Wu, Fremont, CA (US);

Assignee:

Fremonta Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/02 (2006.01); G01N 1/40 (2006.01); G01N 33/02 (2006.01);
U.S. Cl.
CPC ...
G01N 1/4022 (2013.01); G01N 1/02 (2013.01); G01N 1/405 (2013.01); G01N 33/02 (2013.01); G01N 2001/028 (2013.01);
Abstract

Sampling probe devices, systems and methods for sampling frozen or solid meltable products. Such systems can include a heating element for placing against the frozen or solid product and a sampler with a cover fabricated at least partly from a microbial sampling medium so the cover absorbs a liquid sample from the product. Methods of sampling include heating the product and contacting the product with the cover until sufficient liquid sample is absorbed by the cover of the sampler. The cover can be weighed after sampling and compared to a before-sampling weight to confirm sufficient liquid was obtained. The sample can be tested as an aggregate sample that is representative of the lot or batch of product being sampled, including testing without an enrichment procedure. Systems utilizing automated heated-sampling plates and radiative heaters are also described.


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