The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2024

Filed:

Aug. 09, 2019
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Jinxin Fu, Fremont, CA (US);

Tapashree Roy, Bangalore, IN;

Ludovic Godet, Sunnyvale, CA (US);

Wayne McMillan, San Jose, CA (US);

Robert J Visser, Menlo Park, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 3/00 (2006.01); G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
G02B 3/0068 (2013.01); G02B 3/0012 (2013.01); G02B 27/0172 (2013.01);
Abstract

An imaging system and a method of manufacturing a metalens array is provided. The imaging system includes a metalens array, and light scattered from an object is split by the metalens array, such that an image is formed in front of an observer. The metalens array is at least partially transparent to visible light, so that the observer can also see the environment. The method of manufacturing the metalens array includes bonding together a plurality of substrates, and dicing the plurality of substrates into metalens arrays. The metalens arrays can be used in the imaging system.


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