The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Jun. 29, 2021
Applicant:
Samsung Display Co., Ltd., Yongin-si, KR;
Inventors:
Ilha Song, Asan-si, KR;
Mihye Kwon, Asan-si, KR;
Jimin Woo, Asan-si, KR;
Sangdon Hwang, Cheonan-si, KR;
Assignee:
SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/956 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01N 21/95607 (2013.01); G06T 7/11 (2017.01); G01N 2021/95615 (2013.01); G01N 2021/95676 (2013.01); G06T 2207/30148 (2013.01);
Abstract
A mask inspection method includes photographing a cell mask through which openings is formed to obtain an image, setting an area of the image adjacent to an edge of the cell mask as an inspection area, comparing a grayscale of the openings in the inspection area with a reference grayscale, and checking a defect of the cell mask according to a result of the comparing of the grayscale of the openings.
Song, Ilha. (2024). Mask inspection apparatus and mask inspection method using the same (U.S. Patent No. 12045975). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12045975
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile