The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Aug. 25, 2020
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Daisuke Asakawa, Haibara-gun, JP;

Hironori Oka, Haibara-gun, JP;

Kyohei Sakita, Haibara-gun, JP;

Michihiro Shirakawa, Haibara-gun, JP;

Akiyoshi Goto, Haibara-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/004 (2006.01); C08F 220/18 (2006.01); C08F 220/28 (2006.01); C08F 220/34 (2006.01); C08F 220/38 (2006.01); G03F 7/038 (2006.01); G03F 7/039 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0045 (2013.01); C08F 220/1804 (2020.02); C08F 220/1808 (2020.02); C08F 220/283 (2020.02); G03F 7/038 (2013.01); G03F 7/039 (2013.01); C08F 220/346 (2020.02); C08F 220/382 (2020.02);
Abstract

An object of the present invention is to provide an actinic ray-sensitive or radiation-sensitive resin composition which is capable of forming a pattern having an excellent pattern line width roughness (LWR). In addition, another object of the present invention is to provide: The actinic ray-sensitive or radiation-sensitive resin composition of the present invention includes a resin including a repeating unit derived from a monomer having a salt structure and a repeating unit having a group whose polarity increases through decomposition by the action of an acid,


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