The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Aug. 03, 2022
Shanghai Huali Integrated Circuit Corporation, Shanghai, CN;
Zhenan Lai, Shanghai, CN;
Junsheng Chen, Shanghai, CN;
Shanghai Huali Integrated Circuit Corporation, Shanghai, CN;
Abstract
A design-for-test circuit for evaluating a BTI effect is disclosed, the circuit includes a number of stress generators having logic circuits with input and output terminals. Each output terminal is connected to the grid of the device to be tested. In a stress mode, a stress input signal is selected from a frequency signal, a first direct current voltage, and a second direct current voltage, all stress output signals formed by all the stress generators comprise the first direct current voltage, a series of frequency signals with different duty cycles, and the second direct current voltage, and all the stress output signals are used in combination such that the stress times regarding the device under test within the same test time have different values, so as to evaluate the BTI effect of the device under test which has different values of the stress times.