The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Apr. 15, 2022
Applicant:
Western Digital Technologies, Inc., San Jose, CA (US);
Inventors:
Assignee:
Western Digital Technologies, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/36 (2006.01); G11C 29/12 (2006.01); G11C 29/44 (2006.01); G11C 29/46 (2006.01);
U.S. Cl.
CPC ...
G11C 29/36 (2013.01); G11C 29/1201 (2013.01); G11C 29/4401 (2013.01); G11C 29/46 (2013.01); G11C 2029/3602 (2013.01);
Abstract
A memory die assembly, comprising a non-volatile memory structure, performs autonomous testing of the memory die assembly by repeatedly performing a group of tests for multiple cycles such that the group of tests includes programming, erasing and reading the non-volatile memory structure. Failure events from the tests are recorded by storing error data for each recorded failure event including a location in the non-volatile memory structure of the failure event, a type of test that failed and a cycle during which the failure event occurred.