The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Oct. 20, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Bruce A. Liikanen, Berthoud, CO (US);

Larry J. Koudele, Erie, CO (US);

Michael Sheperek, Longmont, CO (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 5/04 (2006.01); G11C 11/56 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3404 (2013.01); G11C 5/04 (2013.01); G11C 11/5628 (2013.01); G11C 11/5642 (2013.01); G11C 16/3459 (2013.01); G11C 2211/5623 (2013.01); G11C 2211/5624 (2013.01); G11C 2211/5625 (2013.01);
Abstract

A processing device determines difference error counts that are indicative of relative widths of valleys. Each of the valleys is located between a respective pair of programming distributions of memory cells of the memory device. A program targeting operation is performed on a memory cell of the memory device to calibrate one or more program verify (PV) targets associated with the programming distributions. To perform the program targeting operation, a rule from a set of rules is selected based on the difference error counts. The set of rules corresponds to an adjusting of a PV target of a last programming distribution. One or more program verify (PV) targets associated with the programming distributions are adjusted based on the selected rule.


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