The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Mar. 26, 2020
Shearography testing method and system using shaped excitation light having at least one curved line
Applicant:
Agency for Science, Technology and Research, Singapore, SG;
Inventors:
Assignee:
AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH, Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01B 11/162 (2013.01); G01B 11/167 (2013.01);
Abstract
A non-contact non-destructive testing method includes spatially and/or temporally controlling a laser excitation light based on a predetermined pattern. The laser excitation light is projected onto a surface of a test object to generate acoustic waves on the test object. The acoustic waves apply stress loading to the test object. The method also includes imaging the test object with and without stress loading using shearography imaging, and analyzing shearography imaging data to determine a presence of a defect in the test object.