The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

May. 02, 2023
Applicant:

Psiquantum, Corp., Palo Alto, CA (US);

Inventors:

Yong Liang, Niskayuna, NY (US);

John Elliott Ortmann, Jr., Palo Alto, CA (US);

John Berg, Palo Alto, CA (US);

Ann Melnichuk, Rio Rancho, NM (US);

Assignee:

PSIQUANTUM, CORP., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 23/02 (2006.01); C30B 23/00 (2006.01); C30B 29/32 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
C30B 23/002 (2013.01); C30B 23/02 (2013.01); C30B 29/32 (2013.01); G06T 7/001 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A method of forming a film comprises growing, using a deposition system, at least a portion of the film and analyzing, using a RHEED instrument, the at least a portion of the film. Using a computer, data is acquired from the RHEED instrument that is indicative of a stoichiometry of the at least a portion of the film. Using the computer, adjustments to one or more process parameters of the deposition system are calculated to control stoichiometry of the film during subsequent deposition. Using the computer, instructions are transmitted to the deposition system to execute the adjustments of the one or more process parameters. Using the deposition system, the one or more process parameters are adjusted.


Find Patent Forward Citations

Loading…