The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Mar. 08, 2022
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Lars Omlor, Pleasanton, CA (US);

Timo Stich, Jena, DE;

Christian Dietrich, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/593 (2017.01); H04N 13/271 (2018.01);
U.S. Cl.
CPC ...
G06T 7/593 (2017.01); H04N 13/271 (2018.05); G06T 2207/10012 (2013.01); G06T 2207/20212 (2013.01);
Abstract

Stereoscopy in which at least one image of a scene is recorded from a first viewing angle, and at least one image of the scene is recorded from a second viewing angle. The scene is recorded multiple times from the first viewing angle. A first combination image is obtained from the various images recorded from the first viewing angle, said combination image according to the stipulation of a comparison algorithm having smaller differences in relation to at least one image also recorded from the second viewing angle or smaller differences in relation to a second combination image obtained from the images from the second viewing angle than each individual image recorded from the first viewing angle. An image of the scene with the depth information is obtained from the first combination image and at least one image from the second viewing angle or the second combination image.


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