The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Feb. 28, 2020
Ihi Corporation, Tokyo, JP;
Toshiaki Hamano, Tokyo, JP;
IHI CORPORATION, Tokyo, JP;
Abstract
An ultrasonic flaw detection device includes: an ultrasonic probe that detects waveform data of ultrasonic echoes emitted to an inspection area of an inspection target; a processing unit that stores pieces of sampling data obtained by sampling the waveform data obtained by the ultrasonic probe at predetermined sampling intervals in a storage unit continuously in time series; and a display control unit that divides the inspection area into a plurality of divided areas and displays each of the plurality of divided areas on a display, wherein the processing unit directly or indirectly links a divided area of the plurality of divided areas to one or more waveform data containing sampling data of one or more sampling point included in the divided area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile