The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Dec. 23, 2020
Applicant:

Grail, Llc, Menlo Park, CA (US);

Inventors:

Matthew H. Larson, San Francisco, CA (US);

Hyunsung John Kim, San Francisco, CA (US);

Nick Eattock, Hercules, CA (US);

Xiao Yang, San Francisco, CA (US);

Assignee:

GRAIL, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C40B 50/06 (2006.01); C12N 15/10 (2006.01); C12Q 1/6806 (2018.01); C12Q 1/6855 (2018.01); C12Q 1/6874 (2018.01);
U.S. Cl.
CPC ...
C40B 50/06 (2013.01); C12N 15/1065 (2013.01); C12N 15/1093 (2013.01); C12Q 1/6806 (2013.01); C12Q 1/6855 (2013.01); C12Q 1/6874 (2013.01);
Abstract

Aspects of the invention relate to methods for preparing and analyzing a sequencing library from a mixed cell-free DNA (cfDNA) sample, wherein the mixed sample includes double-stranded DNA (dsDNA), damaged dsDNA (e.g., nicked dsDNA), and single-stranded DNA (ssDNA) molecules. The subject methods facilitate the collection of information from dsDNA, ssDNA and damaged DNA (e.g., nicked DNA) molecules in a sample, thereby providing enhanced diagnostic information as compared to sequencing libraries that are prepared from dsDNA alone.


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