The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

May. 19, 2021
Applicant:

Jeol Ltd., Tokyo, JP;

Inventors:

Shio En, Tokyo, JP;

Takashi Sato, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/147 (2006.01); B22F 10/80 (2021.01); B22F 12/41 (2021.01); B23K 15/00 (2006.01); B23K 15/02 (2006.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01); H01J 37/09 (2006.01);
U.S. Cl.
CPC ...
H01J 37/1474 (2013.01); B22F 10/80 (2021.01); B22F 12/41 (2021.01); B23K 15/002 (2013.01); B23K 15/0086 (2013.01); B23K 15/02 (2013.01); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12); H01J 37/09 (2013.01);
Abstract

A beam adjustment method includes: installing, on an irradiation surface to which an electron beam is radiated, a detection part having a Faraday cup catching electrical charges of the electron beam, and installing, on a side of an electron gun further than the detection part, a shielding plate having opening holes through which the electron beam is passable. The method includes causing, upon performing beam diameter measurement processing, the electron beam to pass through the opening holes, and radiating the electron beam to the Faraday cup. In addition, the method includes radiating, upon performing normal processing, the electron beam to the shielding plate.


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