The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Sep. 06, 2018
Myriad Women's Health, Inc., South San Francisco, CA (US);
Dale E. Muzzey, San Francisco, CA (US);
Kevin R. Haas, Berkeley, CA (US);
Jeffrey R. Tratner, San Francisco, CA (US);
Kevin M. D'Auria, San Francisco, CA (US);
Myriad Women's Health, Inc., South San Francisco, CA (US);
Abstract
Fetal maternal samples taken from pregnant women include both maternal cell-free DNA and fetal cell-free DNA. Described herein are methods for determining a chromosomal abnormality of a test chromosome in a fetus by analyzing a test maternal sample of a woman carrying said fetus, wherein the test maternal sample comprises fetal cell-free DNA and maternal cell-free DNA. The chromosomal abnormality can be, for example, aneuploidy or the presence of a microdeletion. In some embodiments, the chromosomal abnormality is determined by measuring a dosage of the test chromosome, determining a depth-scaled variation value correlated to an initial number of sequencing reads obtained from an assay of the test maternal sample, and determining an initial value of statistical significance for the test chromosome based on the measured dosage of the test chromosome, an expected dosage of the test chromosome, and the depth-scaled variation value.